GRX Technology Co, Ltd
Product
Test Probe
High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.

Semiconductor Test Probe Moving both ends / Moving one

Semiconductor Test Probe Moving both ends / Moving one

High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.