GRX Technology Co, Ltd
Product
Probe Card
14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

6.56mm Wafer Test Probe | 0.64mm Dia 2A | Chip Test

6.56mm Wafer Test Probe | 0.64mm Dia 2A | Chip Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.3mm Wafer Probe| 0.55mm dia 3A | Chip test

2.3mm Wafer Probe| 0.55mm dia 3A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.3mm Semiconductor Test Probe| 0.31mm dia 1A | Wafer test

2.3mm Semiconductor Test Probe| 0.31mm dia 1A | Wafer test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

3.1mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

3.1mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.