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Home
About us
Company Culture
Honor
Products
USB A Connector
Crystal Device
Ferrite Core
Test Probe
News
Work Center
Help Center
Contact Us
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Power Supply
Connector
USB A Connector
Type C Connector
SD Card Connector
RJ45 Connector
RF Connector
Nano Card Connector
Micro USB
FPC/FFC Connector
M Type Cable Connector
HDMI Connector
DP Connector
BTB Connector
Crystal Device
Diode
Inductor
Resistance
Integrated Circuit
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Ferrite Cores
Test Probe
Product
Semiconductor Probe
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
10mm Wafer Probe| 1.01mm dia 2A | Chip test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
5mm Wafer Probe| 0.91mm dia 2A | Chip test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
10.1mm Wafer Probe| 0.85mm dia 2A | Chip test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application
<p>Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
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