GRX Technology Co, Ltd
Product
Product
Semiconductor Test Socket
31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Wafer Probe| 0.51mm dia 2A | For Wafer Test

4mm Wafer Probe| 0.51mm dia 2A | For Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Probe| 0.35mm dia 1A | IC Test Socket Application

4mm Semiconductor Probe| 0.35mm dia 1A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
10mm Semiconductor Test Probe| 0.28mm dia 1A | Chip test

10mm Semiconductor Test Probe| 0.28mm dia 1A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Probe| 0.2mm dia 1A | Pd Alloy

4mm Semiconductor Probe| 0.2mm dia 1A | Pd Alloy

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.