GRX Technology Co, Ltd
Product
Product
spring probe
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
6.35mm Spring Probe | Chip Test | 0.58mm Dia 2A

6.35mm Spring Probe | Chip Test | 0.58mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4.5mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

4.5mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
5.5mm Wafer Probe| 0.48mm dia 2A | For Semiconductor Test Socket

5.5mm Wafer Probe| 0.48mm dia 2A | For Semiconductor Test Socket

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.