GRX Technology Co, Ltd
Product
Product
vertical probe card
5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test

5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.3mm Wafer Probe| 0.55mm dia 3A | Chip test

2.3mm Wafer Probe| 0.55mm dia 3A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.