GRX Technology Co, Ltd
Product
Wafer Probing
2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10mm Wafer Probe| 1.01mm dia 2A | Chip test

10mm Wafer Probe| 1.01mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

5mm Wafer Probe| 0.91mm dia 2A | Chip test

5mm Wafer Probe| 0.91mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

2.05mm Semi Probe | 0.81mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test

5.85mm Semi Probe | 0.75mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

total 4 page