GRX Technology Co, Ltd
Product
Wafer Test
8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

13.4mm Spring Probe | Chip Test | 0.63mm Dia 2A

13.4mm Spring Probe | Chip Test | 0.63mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.3mm Wafer Probe| 0.56mm dia 3A | Chip test

2.3mm Wafer Probe| 0.56mm dia 3A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

3.6mm Wafer Probe| 0.42mm dia 2A | For Semiconductor Test Socket

3.6mm Wafer Probe| 0.42mm dia 2A | For Semiconductor Test Socket

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.15mm dia 0.2A | Wafer Test

4mm Semiconductor Probe| 0.15mm dia 0.2A | Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.