GRX Technology Co, Ltd
Product
Wafer Test
8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

4mm Semi Probe | 0.78mm Dia 2A | Used for Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
13.4mm Spring Probe | Chip Test | 0.63mm Dia 2A

13.4mm Spring Probe | Chip Test | 0.63mm Dia 2A

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
2.3mm Wafer Probe| 0.56mm dia 3A | Chip test

2.3mm Wafer Probe| 0.56mm dia 3A | Chip test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
3.6mm Wafer Probe| 0.42mm dia 2A | For Semiconductor Test Socket

3.6mm Wafer Probe| 0.42mm dia 2A | For Semiconductor Test Socket

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>
4mm Semiconductor Probe| 0.15mm dia 0.2A | Wafer Test

4mm Semiconductor Probe| 0.15mm dia 0.2A | Wafer Test

<p>Precision semiconductor test probes for IC testing, burn-in analysis &amp; data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.</p>