GRX Technology Co, Ltd
High-frequency Semiconductor Test Probe Double Headed Spring Probe
High-frequency Semiconductor Test Probe Double Headed Spring Probe

High-frequency Semiconductor Test Probe Double Headed Spring Probe

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High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.

  • Product Name: Semiconductor Probe
  • Catalog Number: DE1-026BD57-01C0
  • Current Rating: 1A
  • Contact Resistance: 100 mohms max
  • Bandwidth: -0.83dB @ 19.6GHz
  • Inductace: 1.24nH
  • Captance: 1.64pF
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Semiconductor Test Probe Moving both ends / Moving one
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Plunger Type

 

 

Specification

Barrel:P.B./ Gold Plated

Bottom(plunger):SK4(Be Cu)/Gold Plated

TOP(plunger):SK4(Be Cu)/Gold Plated

Spring:SWPB(SUS)/Gold Plated

Full Stroke:1.0mm

Rated Stroke:0.65mm

Spring Force:[email protected]

Mechanical Life Exceeds:200K

 

 

 

Shenzhen Gaorunxin Technology Co., Ltd

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Shenzhen Gaorunxin Technology Co., Ltd

Related Products

Semiconductor Test Probe Moving both ends / Moving one

Semiconductor Test Probe Moving both ends / Moving one

High-frequency semiconductor testing probes for wafer validation, chip packaging, and communication electronics. Features ultra-low contact resistance (<1mΩ) and 5-40GHz bandwidth, optimized for 5G, automotive, and IoT precision testing.