GRX Technology Co, Ltd
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4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

4.5mm Wafer Test Probe | 0.75mm Dia 2A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4.5mm Wafer Test Probe | 0.75mm Dia 2A | Chip Test

4.5mm Wafer Test Probe | 0.75mm Dia 2A | Chip Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
6.56mm Wafer Test Probe | 0.64mm Dia 2A | Chip Test

6.56mm Wafer Test Probe | 0.64mm Dia 2A | Chip Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
13.4mm Spring Probe | Chip Test | 0.63mm Dia 2A

13.4mm Spring Probe | Chip Test | 0.63mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
6.35mm Spring Probe | Chip Test | 0.58mm Dia 2A

6.35mm Spring Probe | Chip Test | 0.58mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4.5mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

4.5mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

4mm Spring Probe | Semiconductor Test Socket Use | 0.58mm Dia 2A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.3mm Wafer Probe| 0.55mm dia 3A | Chip test

2.3mm Wafer Probe| 0.55mm dia 3A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.3mm Wafer Probe| 0.56mm dia 3A | Chip test

2.3mm Wafer Probe| 0.56mm dia 3A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Wafer Probe| 0.51mm dia 2A | For Wafer Test

4mm Wafer Probe| 0.51mm dia 2A | For Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

2.1mm Wafer Probe| 0.51mm dia 2A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
10mm Wafer Probe| 0.48mm dia 2A | For Probe Card

10mm Wafer Probe| 0.48mm dia 2A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
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