GRX Technology Co, Ltd
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5.5mm Wafer Probe| 0.48mm dia 2A | For Semiconductor Test Socket

5.5mm Wafer Probe| 0.48mm dia 2A | For Semiconductor Test Socket

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
3.6mm Wafer Probe| 0.42mm dia 2A | For Semiconductor Test Socket

3.6mm Wafer Probe| 0.42mm dia 2A | For Semiconductor Test Socket

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

1.85mm Wafer Probe| 0.38mm dia 2A | IC Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
9mm Semiconductor Probe| 0.38mm dia 2A | IC Test

9mm Semiconductor Probe| 0.38mm dia 2A | IC Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Probe| 0.38mm dia 1A | For Probe Card

4mm Semiconductor Probe| 0.38mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

2.3mm Semiconductor Probe| 0.38mm dia 1A | Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Test Socket Probe| 0.35mm dia 1A

4mm Semiconductor Test Socket Probe| 0.35mm dia 1A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Probe| 0.35mm dia 1A | IC Test Socket Application

4mm Semiconductor Probe| 0.35mm dia 1A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
2.1mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

2.1mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
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