GRX Technology Co, Ltd
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DSB221SDN TDS High-precision SMD TCXO

DSB221SDN TDS High-precision SMD TCXO

DSB221SDN 9.6-52MHz low-voltage clipped sine wave crystal with ultra-low phase noise and compact single-package design. Ideal for mobile phones, GPS/GNSS, and industrial radio systems, ensuring precise signal stability in power-sensitive applications.
DT-38, DT-381, DT-26, DT-261 Tuning Fork Crystal Resonator

DT-38, DT-381, DT-26, DT-261 Tuning Fork Crystal Resonator

DT-38, DT-381, DT-26, DT-261 Series Low-Power Tuning Fork Crystal Resonators (32.768kHz to 90kHz), RoHS compliant, 1.0μW ultra-low drive level. Ideal for watches, IoT, and industrial systems with customizable load capacitance, no moisture-proof packaging required.
DST310S Tuning Fork Crystal Resonator for Mobile

DST310S Tuning Fork Crystal Resonator for Mobile

3215 ultra-thin SMD tuning fork crystal resonator with 0.75mm low-profile ceramic-metal package, 50khz series resistance, AEC-Q200 certified. Ideal for automotive multimedia, mobile communications, and smart appliances, ensuring reliable frequency control in harsh environments.
DSX321G/DSX321GK KDS Crystal Resonator for Automotive

DSX321G/DSX321GK KDS Crystal Resonator for Automotive

Ultra-thin 0.75mm SMD crystal resonator for 12MHz+ applications, AEC-Q200 compliant. Combines miniature design, excellent heat resistance, and automotive-grade reliability. Optimized for car navigation, audio systems, and harsh-environment multimedia devices.
DSX221G SMD | MHz Band Crystal Resonators For Automotive

DSX221G SMD | MHz Band Crystal Resonators For Automotive

DSX221G is 2520 SMD Crystal Resonators (12MHz-64MHz) with AEC-Q200 compliance, 0.75mm ultra-low profile, and superior heat resistance. Ideal for Bluetooth, GPS, Wi-Fi, RKE systems, and automotive safety controls. Reliable MHz-band solutions for precision and durability.
14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

14.05mm Semiconductor Probe| 1.68mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

24.9mm Semiconductor Test Probe| 1.311mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

31.5mm Semiconductor Test Probe| 1.27mm dia 1A | Wafer test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

8.2mm Semiconductor Test Probe| 1.2mm dia 1A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
10mm Wafer Probe| 1.01mm dia 2A | Chip test

10mm Wafer Probe| 1.01mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
5mm Wafer Probe| 0.91mm dia 2A | Chip test

5mm Wafer Probe| 0.91mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

10.1mm Wafer Probe| 0.85mm dia 2A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.
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