GRX Technology Co, Ltd
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2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

2.35mm Semiconductor Probe| 0.38mm dia 1A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Test Socket Probe| 0.35mm dia 1A

4mm Semiconductor Test Socket Probe| 0.35mm dia 1A

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.35mm dia 1A | IC Test Socket Application

4mm Semiconductor Probe| 0.35mm dia 1A | IC Test Socket Application

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.1mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

2.1mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

7.05mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

4mm Semiconductor Test Probe| 0.31mm dia 1A | Used Test Wafer

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

2.3mm Semiconductor Test Probe| 0.31mm dia 1A | Wafer test

2.3mm Semiconductor Test Probe| 0.31mm dia 1A | Wafer test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10mm Semiconductor Test Probe| 0.28mm dia 1A | Chip test

10mm Semiconductor Test Probe| 0.28mm dia 1A | Chip test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

10mm Semiconductor Probe| 0.28mm dia 1A | IC Test

10mm Semiconductor Probe| 0.28mm dia 1A | IC Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

4mm Semiconductor Probe| 0.28mm dia 1A | Wafer Test

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

4mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

3.1mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

3.1mm Semiconductor Probe| 0.26mm dia 1A | For Probe Card

Precision semiconductor test probes for IC testing, burn-in analysis & data communication. 0.3mm-2.54mm spacing solutions for chip packaging, AI devices, 5G communications, and RF testing. Custom probe configurations available for mobile tech, high-end connectors, and industrial applications.

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